The "Art" of Phase Noise Measurement
Dieter Scherer
Measuring and specifying phase noise has become increasingly important as phase noise is the limiting facior in many RF and microwave systems,like Doppler radar and space telemetry systems like Doppler Radar or communication links.
The complexity and subtleties of the measurement have earned it the reputation of being more art than science.
This book gives an introduction to phase noise measurement focusing on the two most common and useful techniques, the "Two Source Phase Detector" and the "Delay Line Frequency Discriminator"methods. System limitations are pointed out as well as the potential sources of erroneous data when phase noise is measured in a bench set up.
The 11792C Carrier Noise Test Set is HP's latest contribution in this field, designed to simplify and automate the complex task. A table of comparisons will show where the 11792C and the various other HP solutions are optimally employed.
The complexity and subtleties of the measurement have earned it the reputation of being more art than science.
This book gives an introduction to phase noise measurement focusing on the two most common and useful techniques, the "Two Source Phase Detector" and the "Delay Line Frequency Discriminator"methods. System limitations are pointed out as well as the potential sources of erroneous data when phase noise is measured in a bench set up.
The 11792C Carrier Noise Test Set is HP's latest contribution in this field, designed to simplify and automate the complex task. A table of comparisons will show where the 11792C and the various other HP solutions are optimally employed.
Kateqoriyalar:
İl:
1985
Nəşriyyat:
Hewlett Packard
Dil:
english
Səhifələr:
34
Seriyalar:
Rf & Mlcrowave Measurement Symposlum and Exhibition
Fayl:
PDF, 1.06 MB
IPFS:
,
english, 1985